Our facility houses four electron beam instruments: two Electron Probe Microanalyzers (EPMA) and two Scanning Electron Microscopes (SEM). All instruments utilize the same fundamental principles of electron microscopy and X-ray spectroscopy, but each instrument is equipped with specialized electron sources, detectors, or vacuum systems to enable characterization of a wide array of solid materials.

Conductive Coating

We have high-vacuum coating machines for applying specific thicknesses of various coating materials to ensure samples are electrically conductive.

Transmitted and Reflected Light Microscopes

Our labs house an assortment of light microscopes for viewing samples in preparation for microbeam analysis.

Sample Preparation

We have an array of polishing, sectioning, and mounting equipment for preparing samples.

Desiccation and Furnaces

We use vacuum-furnaces, hot-plates, and fume hoods for desiccation and calcination of samples prior to analysis.

Vacuum Filtration

We have equipment for vacuum filtration for extraction of fine particulates from fluid media for selection and preparation.