Instrumentation

The Electron Microbeam Laboratories houses four electron beam instruments: two Electron Microprobes (Electron Probe Microanalyzers, or EPMA) and two Scanning Electron Microscopes (SEM). All instruments utilize the same fundamental principles of electron microscopy and X-ray spectroscopy, but each instrument is equipped with specialized electron sources, detectors, or vacuum systems to enable characterization of a wide array of solid materials.