GEOSCI 777 – Electron Beam Microanalysis

The purpose of this course is to provide the practical and theoretical background information to enable the application of the scanning electron microscope (SEM) and the electron probe microanalysis (EPMA) for scientific research.

–next offered Spring 2024 by Will Nachlas–

Class Demos

Many science and engineering courses deal at some level with information produced by electron microscopes. If you are an instructor interested in exposing your students to electron microscopy and microanalysis, we are happy to host visiting class groups.

High-voltage electron gun for EPMA capable of producing a sub-micrometer beam at 500-30,000 V
Gas-flow proportional X-ray detector