Scanning Electron Microscopy
The Ray and Mary Wilcox SEM Lab houses a Hitachi S3400 Variable Pressure Scanning Electron Microscope.
This is an accordion element with a series of buttons that open and close related content panels.
Secondary Electron Imaging (SEI)
Backscattered Electron Imaging (BSE)
Hitachi High-Sensitivity BSE detector
Cathodoluminescence Imaging (CL)
Gatan PanaCL/F system
Energy Dispersive Spectroscopy (EDS)
Oxford AZtec EDS system (SDD)
Electron Backscatter Diffraction (EBSD)
Oxford EBSD system